Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles - Advances in Imaging and Electron Physics - - Bücher - Elsevier Science Publishing Co Inc - 9780123813107 - 21. Juni 2011
Bei Nichtübereinstimmung von Cover und Titel gilt der Titel

Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles - Advances in Imaging and Electron Physics

Preis
CA$ 425,49
exkl. MwSt.

Bestellware

Lieferdatum: ca. 18. Jun - 1. Jul

Unsere Kunden sagen:

14-Tage-Rückgaberecht
Topbewertung bei Trustpilot
Zu deiner iMusic Wunschliste hinzufügen

Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles - Advances in Imaging and Electron Physics

Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in these domains.

752 pages

Medien Bücher     Gebundenes Buch   (Buch mit hartem Rücken und steifem Einband)
Erscheinungsdatum 21. Juni 2011
ISBN13 9780123813107
Verlag Elsevier Science Publishing Co Inc
Seitenanzahl 752
Maße 152 × 229 × 40 mm   ·   1,17 kg
Serienredakteur Hawkes, Peter W. (Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics)