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Reliability and Degradation of Iii-v Opt
Osamu Ueda
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Reliability and Degradation of Iii-v Opt
Osamu Ueda
Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems.
372 pages, 1, black & white illustrations
| Medien | Bücher Gebundenes Buch (Buch mit hartem Rücken und steifem Einband) |
| Erscheinungsdatum | 30. September 1996 |
| ISBN13 | 9780890066522 |
| Verlag | Artech House Publishers |
| Seitenanzahl | 372 |
| Maße | 156 × 234 × 22 mm · 648 g |
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