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Characterisation and Control of Defects in Semiconductors - Materials, Circuits and Devices
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Characterisation and Control of Defects in Semiconductors - Materials, Circuits and Devices
This book provides an up-to-date review of the experimental and theoretical methods used for studying defects in semiconductors, this book focuses on recent developments driven by the requirements of new materials, including nitrides, oxide semiconductors and 2-D semiconductors.
596 pages
| Medien | Bücher Gebundenes Buch (Buch mit hartem Rücken und steifem Einband) |
| Erscheinungsdatum | 16. Dezember 2019 |
| ISBN13 | 9781785616556 |
| Verlag | Institution of Engineering and Technolog |
| Seitenanzahl | 596 |
| Maße | 1,09 kg |
| Redakteur | Tuomisto, Filip (Professor, University of Helsinki, Department of Physics, Finland) |