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Cross-Layer Reliability of Computing Systems - Materials, Circuits and Devices
Giorgio Di Natale
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Cross-Layer Reliability of Computing Systems - Materials, Circuits and Devices
Giorgio Di Natale
This book presents state-of-the-art solutions for increasing the resilience of computing systems, both at single levels of abstraction and multi-layers. It is a valuable resource for researchers, postgraduate students and professional computer architects focusing on the dependability of computing systems.
328 pages
| Medien | Bücher Gebundenes Buch (Buch mit hartem Rücken und steifem Einband) |
| Erscheinungsdatum | 22. Oktober 2020 |
| ISBN13 | 9781785617973 |
| Verlag | Institution of Engineering and Technolog |
| Seitenanzahl | 328 |
| Maße | 156 × 234 × 20 mm · 703 g |
| Sprache | Englisch |
| Redakteur | Bosio, Alberto (Full Professor, Ecole Centrale de Lyon - INL, France) |
| Redakteur | Canal, Ramon (Associate Professor, Universitat Politecnica de Catalunya-Barcelona Tech (UPC), Facultat d'Informatica de Barcelona, Catalonia, Spain) |
| Redakteur | Carlo, Stefano Di (Tenured Associate Professor, Politecnico di Torino, Italy) |
| Redakteur | Gizopoulos, Dimitris (Professor, National and Kapodistrian University of Athens, Department of Informatics & Telecommunications, Greece) |
| Redakteur | Natale, Giorgio Di (Director of Research, National Research Center of France, TIMA Laboratory, Grenoble, France) |
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